منابع مشابه
Advances in atomic force microscopy
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force m...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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Atomic force microscope (AFM) is a tool that allows micro and nano scale imaging of samples ranging from solid state physics to biology. AFM uses mechanical forces to sense the sample and recreate a topography image with high spatial resolution. The biggest disadvantage of the standard AFMs is their scanning speed, as it typically takes up to several tens of minutes to capture an image. A lot o...
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No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to ...
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A mode of atomic force microscopy AFM is demonstrated where an oscillating AFM cantilever having linear response is driven with two frequencies in the vicinity of a resonance. New frequencies in the response, known as intermodulation products, are generated when the linearity of the cantilever response is perturbed by the nonlinear tip-surface interaction. A rich structure of the intermodulatio...
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ژورنال
عنوان ژورنال: Reviews of Modern Physics
سال: 2003
ISSN: 0034-6861,1539-0756
DOI: 10.1103/revmodphys.75.949